David G. Cahill
Professor of Materials Science
Donald Biggar Willett Professor of Engineering
Software
Analysis of modulated time-domain thermoreflectance
v.2.6.2, posted October 8, 2008
Labview automation for time-domain thermoreflectance
, posted Jan. 2, 2008
Analysis of 3
w
data for arbitrary multilayer geometry
, posted Jan. 5, 2009
Thermal conductivity data
The files are two columns of ASCII data; the two columns are the temperature in degrees Kelvin and the thermal conductivity in W cm
-
1
K
-
1
.
Bulk materials
amorphous SiO
2
Corning glass ceramic #9606
Corning Pyrex #7740
single crystal yttria-stabilized zirconia, Zr
1
-
x
Y
x
O
2
-
x/2
; x=0.08
single crystal yttria-stabilized zirconia, Zr
1
-
x
Y
x
O
2
-
x/2
; x=0.15
sapphire
single crystal MgO
amorphous As
2
S
3
polycrystalline Si
0.80
Ge
0.20
alloy
amorphous Se
PMMA
Homogeneous thin films
epitaxial Si
0.85
Ge
0.15
alloy
, 1.1 microns thick
amorphous diamond
, filtered-arc deposition, 475 nm thick
diamond-like amorphous carbon
, plasma-assisted CVD, 313 nm thick
soft amorphous carbon
, remote-plasma CVD, 325 nm thick
SiN
x
, atmospheric pressure CVD, 180 nm thick
SiN
x
, plasma CVD, 500 nm thick
SiC
, plasma CVD, 250 nm thick
Dow Corning FOx
, 285 nm thick
Dow Corning XLK
, 500 nm thick
amorphous Al
2
O
3
, ion-beam sputtered, 0.95
m
m thick
k
-
Al
2
O
3
, CVD, 13
m
m thick
a
-
Al
2
O
3
, CVD, 13
m
m thick
Multilayer thin films
Si-Ge superlattice, bilayer thickness = 3.0 nm
Si-Ge superlattice, bilayer thickness = 5.0 nm
Useful data for analyzing TDTR experiments
Temperature dependence of volumetric heat capacity
Al
Al at lower T
Si
Si at higher T
MgO
amorphous SiO
2
TiN at low T
TiN at high T
Al
2
O
3
SrTiO
3
NdGaO
3
Temperature dependence of thermal conductivity
Si
SrTiO
3
NdGaO
3
File translated from T
E
X by
T
T
H
, version 3.74.
On 16 Sep 2009, 12:38.
