David G. Cahill Professor of Materials Science Donald Biggar Willett Professor of Engineering

Software

Analysis of modulated time-domain thermoreflectance v.2.6, posted Jan. 14, 2007.
Labview automation for time-domain thermoreflectance, posted Jan. 2, 2008

Thermal conductivity data

The files are two columns of ASCII data; the two columns are the temperature in degrees Kelvin and the thermal conductivity in W cm^-1 K^-1.

• Bulk materials
  • amorphous SiO₂
  • Corning glass ceramic #9606
  • Corning Pyrex #7740
  • single crystal yttria-stabilized zirconia, Zr_1-xY_xO_2-x/2; x=0.08
  • single crystal yttria-stabilized zirconia, Zr_1-xY_xO_2-x/2; x=0.15
  • sapphire
  • single crystal MgO
  • amorphous As₂S₃
  • polycrystalline Si_0.80Ge_0.20 alloy
  • amorphous Se
  • PMMA
• Homogeneous thin films
  • epitaxial Si_0.85Ge_0.15 alloy, 1.1 microns thick
  • amorphous diamond, filtered-arc deposition, 475 nm thick
  • diamond-like amorphous carbon, plasma-assisted CVD, 313 nm thick
  • soft amorphous carbon, remote-plasma CVD, 325 nm thick
  • SiN_x, atmospheric pressure CVD, 180 nm thick
  • SiN_x, plasma CVD, 500 nm thick
  • SiC, plasma CVD, 250 nm thick
  • Dow Corning FOx, 285 nm thick
  • Dow Corning XLK, 500 nm thick
  • amorphous Al₂O₃, ion-beam sputtered, 0.95 mm thick
  • k-Al₂O₃, CVD, 13 mm thick
  • a-Al₂O₃, CVD, 13 mm thick
• Multilayer thin films
  • Si-Ge superlattice, bilayer thickness = 3.0 nm
  • Si-Ge superlattice, bilayer thickness = 5.0 nm

---

File translated from T_EX by T_TH, version 3.74.
On 02 Jan 2008, 11:02.